Academics > Masters & Ph.D. > Qualifying Exam Syllabi

Signal & Image Processing (SIP)

In the Fall quarter 2012, the SIP Group will offer the qualifying exam in the following two formats. A student taking the quals has the option to take either format. It should be noted that Format I will not be offered after this quarter.

Format I:

Three SIP faculty will be examining students in four different SIP areas as listed below. The students should specify which 3 of the 4 areas they want to be covered in their exam and the available schedule during the exam week as soon as possible.

Linear Systems Theory

C. Phillips, J. Parr, and E. Riskin, Signals, Systems, and Transforms (3rd edition), Chapter 2-7, 9-12.

Convolution
Fourier Transforms
Continuous and Discrete Time Systems
Finding system inputs/outputs, system properties

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Stochastic Processes

Y. Viniotis, Probability & Random Proc. for Electrical Engineers, McGraw Hill, 1998.

Random Variables and Probability
Probability fundamentals - one and multiple random variables, expectations, characteristic functions, independence/uncorrelatedness
Classification of random processes - 2nd order characterization (correlation, power spectral density), ergodicity, stationarity
Filtering by LTI systems
Special Processes - Markov Chains/Processes, Gaussian Processes

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Digital Signal Processing

A.V. Oppenheim, R.W. Schafer, J.R. Buck, /Discrete Time Signal Processing,/ (2nd edition) Prentice Hall 1999,

Or equivalently

A.V. Oppenheim, R.W. Schafer, /Discrete Time Signal Processing,/ (3rd edition) Pearson 2010.

Chapter 7: Filter Design Techniques
Chapter 8.4-8.9: The Discrete Fourier Transform
Chapter 9: Computations of Discrete Fourier Transform

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Digital Image Processing

R.C. Gonzales and R.E. Woods, /Digital Image Processing,/ (3rd edition) Prentice Hall, 2008.

Chapter 2: Digital Image Fundamentals
Chapter 3: Intensity Transformations and Spatial Filtering
Chapter 4: Filtering in the Frequency Domain
Chapter 8: Image Compression
Chapter 9: Morphological Image Processing
Chapter 10: Image Segmentation

Format II:

Format II is the new UWEE SIP group qualifying exam format being offered fall quarter 2012 and will be the only format offered into the future. The exam is given only to students in the UWEE Ph.D. program. The following list indicates what is required to pass this exam and several contingencies.

If the student fails the exam, then the student may take the exam one additional time. If the student fails the exam twice, then the student will be asked to leave the UWEE Ph.D. program. For the purposes of this time of transition from Format I to Format II, if a student previously failed the exam in Format I and then decides to take the second exam in Format II, then they only have one chance to pass the exam in Format II.

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