Conferences with a Strong Focus on Testing Mixed Analog-Digital Systems

• IEEE International Mixed-Signal Test Workshop (IMST)
• IEEE International Test Conference (ITC)
• IEEE VLSI Test Symposium (VTS)
• IEEE International Conference on Computer-Aided Design (ICCAD)
• IEEE DATE Conference
• IEEE Custom Integrated Circuit Conference (CICC)
• IEEE International Symposium on Circuits and Systems (ISCAS)
• IEEE Asian Test Symposium (ATS)

IMSTW

• Current information for the IEEE International Mixed-Signal Test Workshop, the premier meeting in the field.

IEEE 1149.4

• Information for the IEEE 1149.4 Standard for a Mixed Signal Test Bus

Mixed Signal and Other Benchmarks

• EDA Benchmarks for design, test, verification, VHDL, etc.

Organizations and Agencies

• IEEE Test Technology Technical Council
• Semiconductor Research Corporation
• US Defense Advanced Research Project Agency (DARPA)
• NORMATE

University of Washington Information

• Professor Mani Soma's home page
• Department of Electrical Engineering
• College of Engineering
• University of Washington