As a research lab, we seek to establish novel test techniques regarding
mixed-signal circuits and systems. As the mixed-signal ICs get
system-on-a-chip complexity, the problem of mixed-mode test evolves.
The adaptation of BIST (Built-In Self-Test) techniques and any other
DFT (Design For Testability) schemes in this area remains a serious
challenge for circuit and test engineers. By leading in this effort
both in industry and academia, we aim to develop practical and
cost-effective methods in the field of designing and testing of
mixed-signal integrated circuits.